The MikroSystemTechnik Kongress is a joint event of the Federal Ministry of Education and Research and the VDE – Verband der Elektrotechnik Elektronik Informationstechnik e.V. (Association of Electrical, Electronic & Information Technologies).
From 28 to 30 October 2019, employees of the CiS Research Institute will present current development results on optical microsystems, assembly and connection technology as well as measurement technology in three of the offered sessions:
P3: Optical Microsystems
“Spectrally tunable microsensor for gas analysis”, and
“Tolerance analysis for photonic silicon crystals.”
S13: Assembly and connection technology I
“Flip-chip mounting for differential pressure sensor assembly.”
S22: Measurement, Test, Reliability II
“Extension of the range of application of silicon strain sensors by mounting carriers”
