Electromigration in sensor contact systems
| German title: | Elektromigration in Sensor-Kontaktsystemen | |
| Acronym: | EMIC | |
| Duration: | 1st April 2017 - 30th September 2019 | |
| Description: | Highly stable and highly accurate pressure sensors are developed at the CiS Research Institute. Long-term investigations sometimes showed spontaneous drifts at elevated temperatures T <= 135°C associated with the contact system. Starting from an Al-Si (<2%) based contact and guideway system, the mechanisms of electromigration were investigated. Based on this, modifications were made to the contact and guideway design to reduce the influence of electromigration. | |
| Funded by: | BMWI |  |
| Project sponsor: | EuroNorm GmbH | |
| Funding code: | VF160030 | |
News articles about EMIC: | ||
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CiS at SPIE Photonics West 2020 in San Francisco 12. February 2020 |
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