Compact refractive index and film thickness sensor
Quality assessment and process control are important tools in the production of high-quality products. In surface coating, it is necessary to determine essential properties of the applied coatings. This includes the layer thickness and the refractive index.
The compact sensor developed at the CiS Research Institute measures the polarization-dependent reflection of two different single-mode lasers at inclined angles of incidence
Cooperation between CiS Forschungsinstitut GmbH and Yokohama National University in Japan
Dr Thomas Ortlepp takes over the newly created Chair of Sensor Technology and Energy Efficient Microelectronics at Yokohama National University in Japan
CiS Forschungsinstitut für Mikrosensorik GmbH founding member of the German industrial research association “Konrad-Zuse e.V.”
This important alliance creates for the first time a joint platform for the industry-related non-university research partners of SMEs
Young Researcher Award for Dr Gerrit Heinrich
Dr. Gerrit Heinrich, CiS Forschungsinstitut für Mikrosensorik und Photovoltaik GmbH, won the Young Researcher Award 2014 with his topic “Direct laser ablation of thin silicon nitride layers deposited on silicon by nonlinear absorption”
Micro laser illumination for analytics
Laser light has special properties. Its beam can be guided narrowly over long distances and its spectrum is very pure. These properties are being harnessed for small sensors with micro laser illumination. The development goal is to make the length of the assembly smaller than the head of a pin (1.4 mm) and to guide the beam closer than the diameter of the pin (300 μm)
Compact refractive index and film thickness sensor
At the electronica and COMPAMED trade fairs, the CiS Research Institute will present the status of a current sensor development for determining the thickness and refractive indices of thin surface layers, the latter being closely dependent on the chemical and/or stoichiometric composition of the coating materials used
Semiconductor Complex Measurement Station
Manufacturing technology and sensors are tested and characterized with a high level of metrological effort in order to be able to demonstrate the desired properties with long-term stability. Different measurement methods are required for this purpose. The new semiconductor complex measuring station represents a milestone in the characterization of technologies and sensors
Vital parameter sensor for pain patients
A mobile biofeedback system, which records the patient’s vital parameters measured in the external auditory canal, analyzes them with the help of a smartphone app and evaluates them individually, has been developed by the CiS Research Institute together with medical experts and industry partners
Micro Laser Doppler Sensors for Blood Flow Measurements
The CiS Research Institute starts developments on a miniaturized optical sensor for investigations of blood flow velocity in the skin. The sensor principle is based on the laser Doppler method
Piezoresistive micro scanners for inline surface inspection in industrial manufacturing processes
A new miniaturised probe made of monocrystalline silicon with an integrated piezoresistive measuring bridge combines high scanning rates and low scanning force. The force-dependent deflection causes a change in the mechanical voltage, which is evaluated piezoresistively
