The individual analytical techniques available for investigations in the CAK laboratories provide different information about the surface. Some provide mainly physical information, others mainly chemical statements. Often a combination of different analytical methods is helpful to understand and evaluate the surface sufficiently to answer raised questions comprehensively. In the following, our analysis tools are presented here:
- Scanning electron microscopy – SEM
- Energy dispersive X-ray spectroscopy – EDX
- Secondary ion mass spectrometry – SIMS
- Raman spectroscopy
- Focused Ion Beam – FIB
- Atomic Force Microscopy – AFM
- Scanning Infrared Reflection Examination – SIREX
- Light and laser microscopy
- Profilometry (tactile and optical)
